Imaging & Spectroscopy Modules

Imaging & Spectroscopy Modules

The neaSNOM microscope can be equipped with different Near-Field Detection Modules

The award winning microscope design allows 180° optical access to AFM-tip and dual beam access with up to two near-field detection modules for e.g. imaging (left side) & for spectroscopy (right side).

Note: For operation also a Near-Field Illumination Unit is required (available in the visible, NIR, MIR and THz spectral range).

Near-Field Detection Module for Imaging (Reflection)

NeaSNOM_Singe-line-Detection_Module
  • Reflective AFM-tip illumination
  • Detection optimized for high-performance near-field imaging
  • Enables optical amplitude and phase resolved near field measurements
  • Near-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)
  • Patented background-free detection technology
  • Suited for visible & infrared wavelength range (0.5 – 20 µm)
  • Version for infrared & THz wavelength range (5 – 300 µm) available
  • Supported AFM scan-speed: up to 20 µm/s @ highest spatial resolution

 

 

 

 

Near-Field Detection Module for Imaging (Transmission)

NeaSNOM_transmission-mode-module
  • Detection optimized for high performance near-field imaging in transmission-mode
  • Enables optical amplitude and phase resolved near field measurements
  • Patented background-free detection technology
  • Enables bottom-side (transmission-mode) sample illumination with broadband mirror
  • Suited for visible and infrared wavelength range 0.5 – 20 µm
  • Requires transparent sample substrate
  • Motorized parabolic mirror for easy beam-alignment in transmission-mode
  • Stationary focal point with respect to AFM-tip
  • Variable illumination spot size (ca. 2µm – 100µm)
  • Suitable for plane-wave illumination
  • Supported AFM scan-speed: up to 20 µm/s @ highest spatial resolution

 

Near-Field Detection Module for Spectroscopy (nano-FTIR)

NeaSNOM FT-Module
  • Reflective AFM-tip illumination
  • Detection optimized for high-performance near-field spectroscopy
  • Patented background-free detection technology
  • Based on optimized Fourier-Transform spectrometer
  • Up to 3 spectra per second
  • Standard spectral resolution: 6.4/cm
  • Upgrade to 3 cm-1  spectral resolution available
  • Suited for visible & infrared detection (0.5 – 20 µm)
  • Exchangeable beam-splitter mount included
  • NEW: Suited for IR synchrotron sources

 

 

 

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