VT SPM
VT SPM
Benchmarking UHV STM and AFM Technology
- 25 K – 1500 K
- True pA STM
- Improved dI/dV Spectroscopy
- Beam Deflection AFM
- ‘QPlus sensor’ AFM
- In-situ Evaporation
The Omicron VT SPM is a well established microscope in many research labs for Scanning Probe Microscopy. It won the prominent R&D award in 1996. To date, more than 500 instruments have been delivered and successfully installed around the world.
The volume of research results and publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design.
State-of-the-Art STM Technology
The Variable Temperature SPM uses the latest preamplifier technology for true sub-pA scanning tunnelling microscopy and spectroscopy. Stable low current operation is important for the investigation of surfaces that are sensitive or have a low conductivity. For modulation spectroscopy an electronic compensation reduces the influence of parasitic currents. This saves acquisition time and improves results.Superior AFM Technology
The AFM Technology of the Variable Temperature SPM is based on more than 20 years of experience in Atomic Force Microscopy in UHV. It has been continuously developed and improved. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.
The latest major development is a new AFM preamplifier which increases the detection bandwidth from 450 kHz to 2 MHz. In combination with the new AFM electronics (PLL) of the MATRIX Control System, users can now use high resonant frequency cantilevers for high speed non-contact AFM measurements.
This new preamplifier technology in combination with an improved light source is also available as an upgrade package for existing Variable Temperature AFM’s. Please contact your local sales representative or our service support team (service@omicron.de) if you are interested in upgrading your system.
The new “QPlus” sensor, based on a tuning fork design, is today extending the possible application range of the Variable Temperature SPM.
Easy and Safe Sensor Exchange
Eddy Current Damping
Introduced as part of the first commercial UHV STM in the 1980’s, the OMICRON eddy current vibration isolation system defined a milestone in UHV SPM technology. The proven design allows high resolution Scanning Tunnelling Microscopy operation even in non-ideal conditions for more than 25 years.
VT Series
The philosophy of the VT series is to provide a maximum temperature range. Therefore heating is integrated in the sample plate and the cooling connection is removable in UHV. The heating and cooling concept covers a temperature range from 25 K to 1500 K. The VT series uses dedicated sample plates for different temperature ranges.VT XA Series
The VT XA design forms a new series of VT instruments using standard Omicron samples plates. The philosophy of the XA series is to provide maximum compatibility with many different surface science techniques, like MBE, RHEED and different kinds of electron spectroscopy.Standard Omicron sample plates are available in Mo, Ta or stainless steel. Maximum sample size is 11 mm x 11 mm.
STM (VT STM)
The VT STM utilises a scanned tip design with a single tube scanner which has a scan range (xyz) of 12 μm × 12 μm × 1.5 μm. The tips are exchangeable in-situ. The first I/V conversion stage is located in-situ, close to the scanner in order to achieve the best signal-to-noise ratio and optimal performance.STM & AFM (VT AFM)
The VT AFM is an atomic force microscope with beam deflection detection and a scanned tip design. The single tube scanner has a scan range (xyz) of 10 μm × 10 μm × 1.5 μm.It uses remote controlled mirror motors for beam adjustment and a position sensitive photo diode detector.
Operation modes include contact mode with normal force/lateral force detection and non-contact modes (i.e. NC-AFM, SKPM, EFM, MFM). The VT AFM also includes STM detection with the first I/V conversion stage in-situ, located close to the scanner in order to achieve best signal-to-noise ratio and optimal performance.
The scanner is mounted on an independent, orthogonal, and guided 3D coarse positioning device with 10 mm × 10 mm × 10 mm travel in xyz direction. An upgrade for QPlus AFM is available.
‘QPlus Sensor’ AFM (optional)
The ‘QPlus sensor’ is based on a quartz tuning fork and a new approach for non-contact atomic force microscopy. Due to the stiffness of the QPlus sensor (spring constant ~ 1800 N/m), it can be operated with smaller oscillation amplitudes compared to conventional cantilevers. The sensor is also useful for AFM navigation of an STM tip and subsequent STM imaging and spectroscopy.BEEM (optional)
Ballistic electron emission microscopy (BEEM) is a technique for studying ballistic electron transport in a variety of materials and material interfaces. BEEM is a three terminal scanning tunnelling microscopy (STM) technique. While performing BEEM, electrons are injected from a STM tip into the surface.MULTIPROBE XP with VT SPM
SO-VT UHV SPM- SO-VT XA Series
- Interactive PDF